ISMTII 2023
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Invited Speakers

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Florian Pollinger
Doctor
Physikalisch-Technische Bundesanstalt (Germany)
Title: Multi-wavelength interferometry for geodesy and large volume metrology

Satoru Takahashi
Professor
The University of Tokyo (Japan)
Title: Super resolution optical measurement for functional microstructures beyond the diffraction limit

Liang-Chia Chen
Professor
National Taiwan University (Taiwan)
Title: Current advances and challenges in optical metrology for advanced semiconductor packaging

Masato Aketagawa
Professor
Nagaoka University of Technology (Japan)
Title: Picometer displacement/length measurement using regular crystalline lattice and superresolution interferometry

Guanhao Wu
Professor
Tsinghua University (China)
Title: Dual-comb-based distance and multidegree- of-freedom measurements

Daewook Kim
Professor
University of Arizona (USA)
Title: Deflectometry and Interferometry

Sang-Joon Cho
Vice President
Park Systems (South Korea)
Title: Automated Nano-Metrological AFM with Intelligent Data Preparation

Chao Zuo
Professor
Nanjing University of Science and Technology (China)
Title: Learning based fringe projection profilometry

Kye-Sung Lee
Doctor
Korea Basic Science Institute (South Korea)
Title: Tissue culture monitoring using line-field fluorescence microsocpy combined with optical coherence microscopy

Byung-Seon Chun
Doctor
Nanoscope Systems, Inc. (South Korea)
Title: Thermoreflectance microscopy for steadystate and transient thermal analysis of electronic devices in microscopic scale

Chi Ho Ng
Vice President of Technology
LMI Technologies (Canada)
Title: Simplified solutions in an increasingly complicated market

ChaBum Lee
Professor
Texas A&M University (USA)
Title: Wafer-level metrology and inspection for advanced electronics packaging

Matteo Bosi
President
Marposs Korea (Italy)
Title: A capacitor coupling-based instrument to assess in a more reliable way the quality of insulation in mass-produced electric stators and motors

Youjian Song
Professor
Tianjin University (China)
Title: Time-of-flight measurement of microstructures based on electronically controlled optical sampling

Byoung-Ho Lee
Doctor
Hitachi High-tech (Japan)
Title: MI (metrology & inspection): Essential technology for future devices

Taejoong Kim
Doctor
Samsung Electronics (South Korea)
Title: Massive overlay metrology solution by realizing imaging Mueller matrix spectroscopic ellipsometry

Dong-Wook Lee
Doctor
Advanced Materials Research Center, Technology Innovation Institute (UAE)
Title: Deep learning-based stress intensity factors analysis of bi-material interface crack from photoelastic images

Wanxin Sun
Doctor
Bruker Singapore Pte Ltd. (Singapore)
Title: Nano scale physical and chemical property characterization by scanning probe techniques

In-Ho Lee
Doctor
Korea Research Institute of Standards and Science (South Korea)
Title: Designing and exploring super functional materials and devices using evolutionary and deep learning methods

Yang Lu
Professor
China University of Petroleum (UPC) (China)
Title: Ultrafast holographic microscopy based on fs laser for wavefront inspection and biological applications

Rongke Gao
Professor
China University of Petroleum (UPC) (China)
Title: The SERS measurements on micro-nano interface substrate integrated microfluidic biosensor

Ruitao Yang
Professor
Harbin Institute of Technology (China)
Title: Real-time suppression of random phase drift for optical frequency comb ranging with highfrequency intermode beats

Kai Ni
Professor
Tsinghua University (China)
Title: Dual-comb spectroscopy and ranging based on mechanical sharing modelocked fiber lasers

Akifumi Asahara
Professor
University of Electro-Communications (Japan)
Title: Dual-comb spectroscopy extended for spatiotemporal measurement applications using OAM light

Takashi Kato
Professor
University of Electro-Communications (Japan)
Title: Optical phased array with phasecontrolled optical frequency comb

Jiannan Jiao
Professor
Shenzhen University (China)
Title: Generation of non-divergent surface thirdharmonics with a two-photon-polymerized phase-type diffractive micro axicon

Jindong Tian
Professor
Shenzhen University (China)
Title: Quantitative phase imaging for dynamic processes

Huitaek Yun
Professor
Korea Advanced Institute of Science and Technology (South Korea)
Title: Virtual reality based human-machine interface for human-AI collaboration

Jiyeon Choi
Doctor
Korea Institute of Machinery & Materials (South Korea)
Title: Ultrafast laser processing for advanced packaging of glass-based devices

Sangbaek Park
Professor
Chungnam National University (South Korea)
Title: Laser-patterned energy storage devices integrated with wearable electronics

Hyung Cheoul Shim
Doctor
Korea Institute of Machinery & Materials (South Korea)
Title: Advanced characterization of the active materials for lithium Ion batteries using TEM techniques to promote mechanism understanding

Soongeun Kwon
Doctor
Korea Institute of Machinery & Materials (South Korea)
Title: Laser processing of graphene materials for high-performance energy storage devices

In Sung Kang
Doctor
KOH YOUNG TECHNOLOGY, INC. (South Korea)
Title: Optical 3D inspection technologies

Ki Joon Heo
Professor
Chonnam National University (South Korea)
Title: Real-time monitoring of airborne microbial colony forming unit based on on-chip cell imaging platform with continuous aerosol-tohydrosol transfer

Sungho Suh
Doctor
Deutsches Forschungszentrum f+r K+nstliche Intelligenz (Germany)
Title: Remaining useful life prediction of lithium-ion batteries using spatiotemporal transformers

Martin Tangari Larrategui
Doctor
University of Arizona (USA)
Title: Advancements in non-null surface figure measurement interferometry

Ilkoo Kim
Doctor
Gauss Labs (USA)
Title: Universal denoising method for boosting the throughput of semiconductor image metrology

ISMTII2023 Secretariat:
Prof. Young-Jin Kim, KAIST
291 Daehark-ro, Yuseong-gu, Daejeon, Republic of Korea (34141)
Tel. +82-42-350-8206
E-mail. (General) ismtii2023@kspe.or.kr
E-mail. (Account) account@kspe.or.kr